"Partitioning sequential circuits for pseudoexhaustive testing."

Bassam Shaer, Sami A. Al-Arian, David L. Landis (2000)

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DOI: 10.1109/92.894159

access: closed

type: Journal Article

metadata version: 2020-03-11

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Bassam Shaer, Sami A. Al-Arian, David L. Landis:
Partitioning sequential circuits for pseudoexhaustive testing. IEEE Trans. Very Large Scale Integr. Syst. 8(5): 534-541 (2000)

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