"Layout-Based Refined NPSF Model for DRAM Characterization and Testing."

Yiorgos Sfikas, Yiorgos Tsiatouhas, Said Hamdioui (2014)

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DOI: 10.1109/TVLSI.2013.2266281

access: closed

type: Journal Article

metadata version: 2020-03-11

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Yiorgos Sfikas, Yiorgos Tsiatouhas, Said Hamdioui:
Layout-Based Refined NPSF Model for DRAM Characterization and Testing. IEEE Trans. Very Large Scale Integr. Syst. 22(6): 1446-1450 (2014)

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