"Automatic ReRAM SPICE Model Generation From Empirical Data for Fast ..."

JaeHyun Seo et al. (2017)

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DOI: 10.1109/TVLSI.2017.2655730

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/SeoLKLHK17
JaeHyun Seo, Sangheon Lee, Kwangmin Kim, Sooeun Lee, Hyunsang Hwang, Byungsub Kim:
Automatic ReRAM SPICE Model Generation From Empirical Data for Fast ReRAM-Circuit Coevaluation. IEEE Trans. Very Large Scale Integr. Syst. 25(6): 1821-1830 (2017)

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