"The Effect of Random Dopant Fluctuations on Logic Timing at Low Voltage."

Rahul Rithe et al. (2012)

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DOI: 10.1109/TVLSI.2011.2124477

access: closed

type: Journal Article

metadata version: 2021-09-27

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Rahul Rithe, Sharon Chou, Jie Gu, Alice Wang, Satyendra Datla, Gordon Gammie, Dennis Buss, Anantha P. Chandrakasan:
The Effect of Random Dopant Fluctuations on Logic Timing at Low Voltage. IEEE Trans. Very Large Scale Integr. Syst. 20(5): 911-924 (2012)

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