"A Cost-Effective Fault Tolerance Technique for Functional TSV in 3-D ICs."

Raviteja P. Reddy, Amit Acharyya, S. Saqib Khursheed (2017)

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DOI: 10.1109/TVLSI.2017.2681703

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/ReddyAK17
Raviteja P. Reddy, Amit Acharyya, S. Saqib Khursheed:
A Cost-Effective Fault Tolerance Technique for Functional TSV in 3-D ICs. IEEE Trans. Very Large Scale Integr. Syst. 25(7): 2071-2080 (2017)

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