"Broad-Brush Compaction for Sequential Test Generation."

Irith Pomeranz (2020)

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DOI: 10.1109/TVLSI.2020.2992097

access: closed

type: Journal Article

metadata version: 2020-08-26

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Irith Pomeranz:
Broad-Brush Compaction for Sequential Test Generation. IEEE Trans. Very Large Scale Integr. Syst. 28(8): 1940-1944 (2020)

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