"Analysis of Resistive-Open Defects in SRAM Sense Amplifiers."

Alexandre Ney et al. (2009)

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DOI: 10.1109/TVLSI.2008.2005194

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/NeyGPVB09
Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian:
Analysis of Resistive-Open Defects in SRAM Sense Amplifiers. IEEE Trans. Very Large Scale Integr. Syst. 17(10): 1556-1559 (2009)

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