"A Comprehensive Framework for Parametric Failure Modeling and Yield ..."

Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori (2019)

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DOI: 10.1109/TVLSI.2019.2904197

access: closed

type: Journal Article

metadata version: 2020-03-11

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Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
A Comprehensive Framework for Parametric Failure Modeling and Yield Analysis of STT-MRAM. IEEE Trans. Very Large Scale Integr. Syst. 27(7): 1697-1710 (2019)

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