"Design of wireless on-wafer submicron characterization system."

Brian Moore, Martin Margala, Christopher J. Backhouse (2005)

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DOI: 10.1109/TVLSI.2004.840780

access: closed

type: Journal Article

metadata version: 2020-03-11

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Brian Moore, Martin Margala, Christopher J. Backhouse:
Design of wireless on-wafer submicron characterization system. IEEE Trans. Very Large Scale Integr. Syst. 13(2): 169-180 (2005)

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