"Trading off transient fault tolerance and power consumption in deep ..."

Atul Maheshwari, Wayne P. Burleson, Russell Tessier (2004)

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DOI: 10.1109/TVLSI.2004.824302

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type: Journal Article

metadata version: 2022-06-10

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Atul Maheshwari, Wayne P. Burleson, Russell Tessier:
Trading off transient fault tolerance and power consumption in deep submicron (DSM) VLSI circuits. IEEE Trans. Very Large Scale Integr. Syst. 12(3): 299-311 (2004)

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