"A Defect-Tolerant Reusable Network of DACs for Wafer-Scale Integration."

Nicolas Laflamme-Mayer et al. (2019)

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DOI: 10.1109/TVLSI.2018.2876458

access: closed

type: Journal Article

metadata version: 2025-01-19

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Nicolas Laflamme-Mayer, Gilbert Kowarzyk, Yves Blaquière, Yvon Savaria, Mohamad Sawan:
A Defect-Tolerant Reusable Network of DACs for Wafer-Scale Integration. IEEE Trans. Very Large Scale Integr. Syst. 27(2): 304-315 (2019)

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