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"Fine-Grain Voltage Tuned Cache Architecture for Yield Management Under ..."
Joonho Kong et al. (2012)
- Joonho Kong, Yan Pan, Serkan Ozdemir, Anitha Mohan, Gokhan Memik, Sung Woo Chung:
Fine-Grain Voltage Tuned Cache Architecture for Yield Management Under Process Variations. IEEE Trans. Very Large Scale Integr. Syst. 20(8): 1532-1536 (2012)
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