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"DFT and Minimum Leakage Pattern Generation for Static Power Reduction ..."

Wei-Chung Kao et al. (2010)

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DOI: 10.1109/TVLSI.2008.2011048

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/KaoCLLM10
Wei-Chung Kao, Wei-Shun Chuang, Shiu-Ting Lin, Chien-Mo James Li, Vasco M. Manquinho:
DFT and Minimum Leakage Pattern Generation for Static Power Reduction During Test and Burn-In. IEEE Trans. Very Large Scale Integr. Syst. 18(3): 392-400 (2010)

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