"Design of a Practical Nanometer-Scale Redundant Via-Aware Standard Cell ..."

Tsang-Chi Kan et al. (2013)

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DOI: 10.1109/TVLSI.2011.2176968

access: closed

type: Journal Article

metadata version: 2020-03-11

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Tsang-Chi Kan, Shih-Hsien Yang, Ting-Feng Chang, Shanq-Jang Ruan:
Design of a Practical Nanometer-Scale Redundant Via-Aware Standard Cell Library for Improved Redundant Via1 Insertion Rate. IEEE Trans. Very Large Scale Integr. Syst. 21(1): 142-147 (2013)

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