"Fast and accurate quasi-three-dimensional capacitance determination of ..."

Woojin Jin et al. (2001)

> Home

Details and statistics

DOI: 10.1109/92.929579

access: closed

type: Journal Article

metadata version: 2024-10-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tvlsi/JinEES01
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tvlsi/JinEES01
Woojin Jin, Yungseon Eo, William R. Eisenstadt, Jongin Shim:
Fast and accurate quasi-three-dimensional capacitance determination of multilayer VLSI interconnects. IEEE Trans. Very Large Scale Integr. Syst. 9(3): 450-460 (2001)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.