"A Fast Built-in Redundancy Analysis for Memories With Optimal Repair Rate ..."

Woosik Jeong et al. (2009)

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DOI: 10.1109/TVLSI.2008.2005988

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/JeongKJK09
Woosik Jeong, Ilkwon Kang, Kyowon Jin, Sungho Kang:
A Fast Built-in Redundancy Analysis for Memories With Optimal Repair Rate Using a Line-Based Search Tree. IEEE Trans. Very Large Scale Integr. Syst. 17(12): 1665-1678 (2009)

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