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"Slew-Rate Monitoring Circuit for On-Chip Process Variation Detection."

Amlan Ghosh et al. (2013)

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DOI: 10.1109/TVLSI.2012.2218838

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - journals/tvlsi/GhoshRKCB13
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  - https://dblp.org/rec/journals/tvlsi/GhoshRKCB13
Amlan Ghosh, Rahul M. Rao, Jae-Joon Kim, Ching-Te Chuang, Richard B. Brown:
Slew-Rate Monitoring Circuit for On-Chip Process Variation Detection. IEEE Trans. Very Large Scale Integr. Syst. 21(9): 1683-1692 (2013)

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