"Application Exploration for 3-D Integrated Circuits: TCAM, FIFO, and FFT ..."

William Rhett Davis et al. (2009)

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DOI: 10.1109/TVLSI.2008.2009352

access: closed

type: Journal Article

metadata version: 2021-10-14

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William Rhett Davis, Eun Chu Oh, Ambarish M. Sule, Paul D. Franzon:
Application Exploration for 3-D Integrated Circuits: TCAM, FIFO, and FFT Case Studies. IEEE Trans. Very Large Scale Integr. Syst. 17(4): 496-506 (2009)

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