"A Built-In Repair Analyzer With Optimal Repair Rate for Word-Oriented ..."

Jaeyong Chung, Joonsung Park, Jacob A. Abraham (2013)

> Home

Details and statistics

DOI: 10.1109/TVLSI.2011.2182217

access: closed

type: Journal Article

metadata version: 2020-03-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tvlsi/ChungPA13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tvlsi/ChungPA13
Jaeyong Chung, Joonsung Park, Jacob A. Abraham:
A Built-In Repair Analyzer With Optimal Repair Rate for Word-Oriented Memories. IEEE Trans. Very Large Scale Integr. Syst. 21(2): 281-291 (2013)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.