"Design Margin Exploration of Spin-Transfer Torque RAM (STT-RAM) in Scaled ..."

Yiran Chen et al. (2010)

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DOI: 10.1109/TVLSI.2009.2032192

access: closed

type: Journal Article

metadata version: 2022-07-04

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Yiran Chen, Xiaobin Wang, Hai Li, Haiwen Xi, Yuan Yan, Wenzhong Zhu:
Design Margin Exploration of Spin-Transfer Torque RAM (STT-RAM) in Scaled Technologies. IEEE Trans. Very Large Scale Integr. Syst. 18(12): 1724-1734 (2010)

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