"An Overlapping Scan Architecture for Reducing Both Test Time and Test ..."

Xiaoding Chen, Michael S. Hsiao (2007)

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DOI: 10.1109/TVLSI.2007.893657

access: closed

type: Journal Article

metadata version: 2020-03-11

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Xiaoding Chen, Michael S. Hsiao:
An Overlapping Scan Architecture for Reducing Both Test Time and Test Power by Pipelining Fault Detection. IEEE Trans. Very Large Scale Integr. Syst. 15(4): 404-412 (2007)

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