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"An ROBDD-Based Combinatorial Method for the Evaluation of Yield of ..."
Juan A. Carrasco, Víctor Suñé (2009)
- Juan A. Carrasco, Víctor Suñé:
An ROBDD-Based Combinatorial Method for the Evaluation of Yield of Defect-Tolerant Systems-on-Chip. IEEE Trans. Very Large Scale Integr. Syst. 17(2): 207-220 (2009)
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