"Reducing Rollback Cost in VLSI Circuits to Improve Fault Tolerance."

Thierry Bonnoit, Nacer-Eddine Zergainoh, Michael Nicolaidis (2018)

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DOI: 10.1109/TVLSI.2018.2818021

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type: Journal Article

metadata version: 2020-03-11

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Thierry Bonnoit, Nacer-Eddine Zergainoh, Michael Nicolaidis:
Reducing Rollback Cost in VLSI Circuits to Improve Fault Tolerance. IEEE Trans. Very Large Scale Integr. Syst. 26(8): 1438-1451 (2018)

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