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"On the design of fast, easily testable ALU's."

Ronald D. Blanton, John P. Hayes (2000)

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DOI: 10.1109/92.831442

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/BlantonH00
Ronald D. Blanton, John P. Hayes:
On the design of fast, easily testable ALU's. IEEE Trans. Very Large Scale Integr. Syst. 8(2): 220-223 (2000)

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