"Predicting Shot-Level SRAM Read/Write Margin Based on Measured Transistor ..."

Shu-Yung Bin et al. (2016)

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DOI: 10.1109/TVLSI.2015.2418998

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type: Journal Article

metadata version: 2020-03-11

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Shu-Yung Bin, Shih-Feng Lin, Ya Ching Cheng, Wen-Rong Liau, Alex Hou, Mango C.-T. Chao:
Predicting Shot-Level SRAM Read/Write Margin Based on Measured Transistor Characteristics. IEEE Trans. Very Large Scale Integr. Syst. 24(2): 625-637 (2016)

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