"Embedded Deterministic Test Points."

Cesar Acero et al. (2017)

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DOI: 10.1109/TVLSI.2017.2717844

access: closed

type: Journal Article

metadata version: 2020-03-11

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Cesar Acero, Derek Feltham, Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee, Marek Patyra, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Justyna Zawada:
Embedded Deterministic Test Points. IEEE Trans. Very Large Scale Integr. Syst. 25(10): 2949-2961 (2017)

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