"A Framework for Inference Using Goodness of Fit Tests Based on Ensemble of ..."

Nikhil Kundargi, Yingxi Liu, Ahmed H. Tewfik (2013)

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DOI: 10.1109/TSP.2012.2226448

access: closed

type: Journal Article

metadata version: 2020-03-10

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Nikhil Kundargi, Yingxi Liu, Ahmed H. Tewfik:
A Framework for Inference Using Goodness of Fit Tests Based on Ensemble of Phi-Divergences. IEEE Trans. Signal Process. 61(4): 945-955 (2013)

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