"Test sequencing algorithms with unreliable tests."

Vijay Raghavan, Mojdeh Shakeri, Krishna R. Pattipati (1999)

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DOI: 10.1109/3468.769753

access: closed

type: Journal Article

metadata version: 2020-05-25

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Vijay Raghavan, Mojdeh Shakeri, Krishna R. Pattipati:
Test sequencing algorithms with unreliable tests. IEEE Trans. Syst. Man Cybern. Part A 29(4): 347-357 (1999)

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