"Application of an Ordinal Optimization Algorithm to the Wafer Testing Process."

S.-Y. Lin, S.-C. Horng (2006)

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DOI: 10.1109/TSMCA.2006.878965

access: closed

type: Journal Article

metadata version: 2020-05-25

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S.-Y. Lin, S.-C. Horng:
Application of an Ordinal Optimization Algorithm to the Wafer Testing Process. IEEE Trans. Syst. Man Cybern. Part A 36(6): 1229-1234 (2006)

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