"Fault diagnosis of electronic systems using intelligent techniques: a review."

W. G. Fenton, T. Martin McGinnity, Liam P. Maguire (2001)

> Home

Details and statistics

DOI: 10.1109/5326.971655

access: closed

type: Journal Article

metadata version: 2020-10-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tsmc/FentonMM01
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tsmc/FentonMM01
W. G. Fenton, T. Martin McGinnity, Liam P. Maguire:
Fault diagnosis of electronic systems using intelligent techniques: a review. IEEE Trans. Syst. Man Cybern. Part C 31(3): 269-281 (2001)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.