"Black-Box Modeling of Back-Up Short-Circuit Tests."

Federico Bizzarri et al. (2024)

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DOI: 10.1109/TSG.2020.3036210

access: closed

type: Journal Article

metadata version: 2024-01-13

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Federico Bizzarri, Luca Ghezzi, Matteo Maglio, Angelo Brambilla:
Black-Box Modeling of Back-Up Short-Circuit Tests. IEEE Trans. Smart Grid 15(1): 1177-1179 (2024)

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