"Better Data Labelling With EMBLEM (and how that Impacts Defect Prediction)."

Huy Tu, Zhe Yu, Tim Menzies (2022)

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DOI: 10.1109/TSE.2020.2986415

access: closed

type: Journal Article

metadata version: 2022-08-16

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Huy Tu, Zhe Yu, Tim Menzies:
Better Data Labelling With EMBLEM (and how that Impacts Defect Prediction). IEEE Trans. Software Eng. 48(2): 278-294 (2022)

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