"Robust Test Selection for Deep Neural Networks."

Weifeng Sun et al. (2023)

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DOI: 10.1109/TSE.2023.3330982

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type: Journal Article

metadata version: 2025-01-29

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Weifeng Sun, Meng Yan, Zhongxin Liu, David Lo:
Robust Test Selection for Deep Neural Networks. IEEE Trans. Software Eng. 49(12): 5250-5278 (2023)

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