"Deep Just-In-Time Defect Localization."

Fangcheng Qiu et al. (2022)

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DOI: 10.1109/TSE.2021.3135875

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type: Journal Article

metadata version: 2023-01-15

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Fangcheng Qiu, Zhipeng Gao, Xin Xia, David Lo, John C. Grundy, Xinyu Wang:
Deep Just-In-Time Defect Localization. IEEE Trans. Software Eng. 48(12): 5068-5086 (2022)

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