"Reliability Experience with Chi/OS."

William C. Lynch, John W. Langner, Marvin S. Schwartz (1975)

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DOI: 10.1109/TSE.1975.6312845

access: closed

type: Journal Article

metadata version: 2023-08-28

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William C. Lynch, John W. Langner, Marvin S. Schwartz:
Reliability Experience with Chi/OS. IEEE Trans. Software Eng. 1(2): 253-257 (1975)

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