"Image analysis methods for solderball inspection in integrated circuit ..."

Wolf-Ekkehard Blanz, Jorge L. C. Sanz, Eric B. Hinkle (1988)

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DOI: 10.1109/56.2076

access: closed

type: Journal Article

metadata version: 2020-05-19

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Wolf-Ekkehard Blanz, Jorge L. C. Sanz, Eric B. Hinkle:
Image analysis methods for solderball inspection in integrated circuit manufacturing. IEEE J. Robotics Autom. 4(2): 129-139 (1988)

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