"Yield Prediction for Integrated Circuits Manufacturing Through ..."

Tao Yuan, Saleem Z. Ramadan, Suk Joo Bae (2011)

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DOI: 10.1109/TR.2011.2161698

access: closed

type: Journal Article

metadata version: 2024-08-04

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Tao Yuan, Saleem Z. Ramadan, Suk Joo Bae:
Yield Prediction for Integrated Circuits Manufacturing Through Hierarchical Bayesian Modeling of Spatial Defects. IEEE Trans. Reliab. 60(4): 729-741 (2011)

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