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"Accelerated degradation-tests with tightened critical values."

Guangbin Yang, Kai Yang (2002)

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DOI: 10.1109/TR.2002.804490

access: closed

type: Journal Article

metadata version: 2022-10-12

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Guangbin Yang, Kai Yang:
Accelerated degradation-tests with tightened critical values. IEEE Trans. Reliab. 51(4): 463-468 (2002)

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