"A Pruning and Feedback Strategy for Locating Reliability-Critical Gates in ..."

Jie Xiao et al. (2023)

> Home

Details and statistics

DOI: 10.1109/TR.2022.3197787

access: closed

type: Journal Article

metadata version: 2023-09-24

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tr/XiaoZSLL23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tr/XiaoZSLL23
Jie Xiao, Weidong Zhu, Qing Shen, Haixia Long, Jungang Lou:
A Pruning and Feedback Strategy for Locating Reliability-Critical Gates in Combinational Circuits. IEEE Trans. Reliab. 72(3): 1078-1092 (2023)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.