"Optimal Step-Stress Accelerated Degradation Test Plan for Gamma ..."

Sheng-Tsaing Tseng, Narayanaswamy Balakrishnan, Chih-Chun Tsai (2009)

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DOI: 10.1109/TR.2009.2033734

access: closed

type: Journal Article

metadata version: 2020-07-09

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Sheng-Tsaing Tseng, Narayanaswamy Balakrishnan, Chih-Chun Tsai:
Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes. IEEE Trans. Reliab. 58(4): 611-618 (2009)

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