"Optimal Design for Degradation Tests Based on Gamma Processes With Random ..."

Chih-Chun Tsai, Sheng-Tsaing Tseng, Narayanaswamy Balakrishnan (2012)

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DOI: 10.1109/TR.2012.2194351

access: closed

type: Journal Article

metadata version: 2020-07-09

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Chih-Chun Tsai, Sheng-Tsaing Tseng, Narayanaswamy Balakrishnan:
Optimal Design for Degradation Tests Based on Gamma Processes With Random Effects. IEEE Trans. Reliab. 61(2): 604-613 (2012)

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