"Lifetime Inference for Highly Reliable Products Based on Skew-Normal ..."

Chih-Chun Tsai, Chien-Tai Lin (2015)

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DOI: 10.1109/TR.2015.2419618

access: closed

type: Journal Article

metadata version: 2020-07-09

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Chih-Chun Tsai, Chien-Tai Lin:
Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model. IEEE Trans. Reliab. 64(4): 1340-1355 (2015)

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