"New cumulative damage models for failure using stochastic processes as ..."

Chanseok Park, William J. Padgett (2005)

> Home

Details and statistics

DOI: 10.1109/TR.2005.853278

access: closed

type: Journal Article

metadata version: 2023-10-19

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tr/ParkP05
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tr/ParkP05
Chanseok Park, William J. Padgett:
New cumulative damage models for failure using stochastic processes as initial damage. IEEE Trans. Reliab. 54(3): 530-540 (2005)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.