"A reliability test-plan for series systems with components having ..."

J. Hariharan Nair, Sanjeev V. Sabnis (2002)

> Home

Details and statistics

DOI: 10.1109/24.994899

access: closed

type: Journal Article

metadata version: 2020-07-09

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tr/NairS02
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tr/NairS02
J. Hariharan Nair, Sanjeev V. Sabnis:
A reliability test-plan for series systems with components having stochastic failure rates. IEEE Trans. Reliab. 51(1): 17-22 (2002)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.