"Software reliability growth with test coverage."

Yashwant K. Malaiya et al. (2002)

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DOI: 10.1109/TR.2002.804489

access: closed

type: Journal Article

metadata version: 2020-07-09

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Yashwant K. Malaiya, Michael Naixin Li, James M. Bieman, Rick Karcich:
Software reliability growth with test coverage. IEEE Trans. Reliab. 51(4): 420-426 (2002)

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