"Computing Multi-State Two-Terminal Reliability Through Critical Arc States ..."

Chin-Chia Jane, Yih-Wenn Laih (2010)

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DOI: 10.1109/TR.2010.2046805

access: closed

type: Journal Article

metadata version: 2020-07-09

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Chin-Chia Jane, Yih-Wenn Laih:
Computing Multi-State Two-Terminal Reliability Through Critical Arc States That Interrupt Demand. IEEE Trans. Reliab. 59(2): 338-345 (2010)

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