"Accelerated Life Tests for Weibull Series Systems With Masked Data."

Tsai-Hung Fan, Wan-Lun Wang (2011)

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DOI: 10.1109/TR.2011.2134270

access: closed

type: Journal Article

metadata version: 2020-07-09

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Tsai-Hung Fan, Wan-Lun Wang:
Accelerated Life Tests for Weibull Series Systems With Masked Data. IEEE Trans. Reliab. 60(3): 557-569 (2011)

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