"Random-Effect Models for Degradation Analysis Based on Nonlinear Tweedie ..."

Zhen Chen et al. (2022)

> Home

Details and statistics

DOI: 10.1109/TR.2021.3107050

access: closed

type: Journal Article

metadata version: 2023-08-28

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tr/ChenXLP22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tr/ChenXLP22
Zhen Chen, Tangbin Xia, Yaping Li, Ershun Pan:
Random-Effect Models for Degradation Analysis Based on Nonlinear Tweedie Exponential-Dispersion Processes. IEEE Trans. Reliab. 71(1): 47-62 (2022)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.