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"Multiple-Stress Model for One-Shot Device Testing Data Under Exponential ..."
Narayanaswamy Balakrishnan, Man Ho Ling (2012)
- Narayanaswamy Balakrishnan, Man Ho Ling:
Multiple-Stress Model for One-Shot Device Testing Data Under Exponential Distribution. IEEE Trans. Reliab. 61(3): 809-821 (2012)
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