"Optimal simple step-stress plan for cumulative exposure model using ..."

Abdulla A. Alhadeed, Shie-Shien Yang (2005)

> Home

Details and statistics

DOI: 10.1109/TR.2004.841704

access: closed

type: Journal Article

metadata version: 2020-07-09

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tr/AlhadeedY05
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tr/AlhadeedY05
Abdulla A. Alhadeed, Shie-Shien Yang:
Optimal simple step-stress plan for cumulative exposure model using log-normal distribution. IEEE Trans. Reliab. 54(1): 64-68 (2005)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.